Publications

P. H. Barchi, R. R. de Carvalho, R. R. Rosa, R. Sautter, M. Soares-Santos, B. A. D. Marques, E. Clua. Machine and Deep Learning Applied to Galaxy Morphology - A Comparative Study. 2019, Astronomy and Computing, v. 30, n. 100334. DOI: 10.1016/j.ascom.2019.100334. [ Astronomy and Computing | arXiv ]

R. R. Rosa, J. Neelakshi, G. A. L. L. Pinheiro, P. H. Barchi, E. H. Shiguemori. Chapter 12: Modeling Social and Geopolitical Disasters as Extreme Events: A Case Study Considering the Complex Dynamics of International Armed Conflicts. Editors: L. B. L. Santos, R. G. Negri, T. J. de Carvalho. Book title: Towards Mathematics, Computers and Environment: A Disasters Perspective. ISBN: 978-3-030-21205-6. Springer International Publishing, 2019. Pages 233--254. DOI: 10.1007/978-3-030-21205-6_12. [ Springer ]

R. R. Rosa, R. R. de Carvalho, R. Sautter, P. H. Barchi, D. H. Stalder, T. C. Moura, S. B. Rembold, D. R. F. Morell, N. C. Ferreira. Gradient Pattern Analysis Applied to Galaxy Morphology. 2018, MNRASL, v. 477, n. 1, p. L101-105, DOI: 10.1093/mnrasl/sly054. [ arXiv | ADS ]

P. H. Barchi, F. G. da Costa, R. Sautter, T. C. Moura, D. H. Stalder, R. R. Rosa, R. R. de Carvalho. Improving Galaxy Morphology with Machine Learning. Bulletin of the Brazilian Astronomical Society (SAB). 2018, v. 30, n. 1, p. 180-181. ISSN: 0101-3440. [ SAB - PDF ]

R. Sautter, P. H. Barchi. pyGHS: Computing Geometric Histogram Separation in Binomial Proportion Patterns. 2017, JCIS, v. 8, issue 1, paper 121. DOI: 10.6062/jcis.2017.08.01.0121. [ JCIS ]

P. H. Barchi, F. G. da Costa, R. Sautter, T. C. Moura, D. H. Stalder, R. R. Rosa, R. R. de Carvalho. Improving Galaxy Morphology with Machine Learning. 2016, JCIS, v. 7, issue 3, paper 114. DOI: 10.6062/jcis.2016.07.03.0114. [ JCIS ]

P. H. Barchi, E. R. Hruscka Jr. Two different approaches to Ontology Extension Through Machine Reading. JNIC, 2015, v. 03, p. 078-087. [ JNIC - PDF ]

P. H. Barchi, E. R. Hruscka Jr. Never-Ending Ontology Extension Through Machine Reading. 2014, ICHIS, page 266. DOI: 10.1109/HIS.2014.7086210. [ IEEE ]